Imaging Nanoscale Polarization in Ferroelectrics with Coherent X-Rays

Seeing the fine-scale properties of materials relevant to nanotechnology is a prominent challenge that currently can be met only under ideal conditions. Coherent X-ray imaging promises to greatly expand the range of materials and environments in which these important properties can be observed. Users from Argonne's Materials Science and Nanoscience & Technology divisions, in collaboration with the X-Ray Microscopy Group at the Center for Nanoscale Materials and researchers from the Advanced Photon Source, KAIST, Northern Illinois University, and the University of Melbourne,have reported the use of a new X-ray imaging technique, coherent X-ray Bragg projection ptychography, applied to the study of nanoscale structures in ferroelectric thin films. (More>>)