Proximal Probes

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Variable-temperature, ultra-high-vacuum, atomic force microscope/scanning tunneling microscope:
Omicron VT-AFM XA
(N. Guisinger, Electronic & Magnetic Materials & Devices Group)

• Measurement modes include:
• Contact and non-contact AFM
• Magnetic force microscopy (MFM)
• Scanning tunneling spectroscopy
• Preparation tools include:
• Resistive sample heating
• Direct current heating
• E-beam heating
• Sputter ion etching
• Gas dosing
• E-beam evaporation
• An analysis chamber contains combined four-grid LEED/Auger optics

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Scanning probe/scanning electron microscopy: Omicron UHV Nanoprobe
(N. Guisinger, Electronic & Magnetic Materials & Devices Group)

• Local, nondestructive four-point contact measurements and function testing of nanodevices within complex structures; accurate probe positioning and safe approach of fragile probe tips having diameters in the range of a few tens of nanometers or less.
• Four independent STM probe tips with simultaneous SEM imaging enables a large field of view for coarse positioning as well as fine positioning of nanometer-sized structures with the SEM's high-resolution capabilities.
• UHV Gemini column for chemical mapping by scanning auger microscopy and magnetic imaging by SEM with polarization analysis (SEMPA). This yields complementary information on sample conductance, topography, chemistry, and magnetism.

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Scanning probe microscopy

• Veeco Multimode with NanoScope V Controller
  (S. Darling, Electronic & Magnetic Materials & Devices Group)
• Ambient measurements in contact or tapping mode
• Fluid imaging
• Low-current scanning tunneling microscopy
• Magnetic force microscopy
• Scanning tunneling microscopy
• Variable temperature imaging
• PSIA XE-HDD with 6-inch wafer stage
  (R. Divan, Nanofabrication Group)
• contact and non-contact modes
• scanning thermal microscopy
• magnetic force microscopy

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Near-field scanning optical microscope
(NSOM, see D. Gosztola, Nanophotonics Group)

• Apertureless and aperture
• Laser excitation from 260 nm to 2.4 microns.
• Variable illumination and detection geometries to accommodate a range of samples and near-field contrast mechanisms.